Silicon dioxide deposition method using a magnetic field and bot

Heating – Heating apparatus element having protective cooling structure – Conveyor – chute or work agitator element

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437 50, 437225, 437228, 437238, 427 38, 427 39, 427 47, 20419212, 20419215, H01L 2100, H01L 2102, H01L 2128, H01L 2188

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050894420

ABSTRACT:
In plasma enhanced chemical vapor deposition (PECVD) of silicon dioxide on a substrate, voids and discontinuities are reduced by first depositing silicon dioxide in a sputter each chamber (22) in which a magnetic field is produced within the rf plasma for depositing the silicon dioxide. Simultaneous sputter etch and deposition occurs which inhibits net deposition at the corners of metal conductors over which the silicon dioxide is deposited. The substrate is then removed and transferred through a load lock (27) to a conventional PECVD deposition chamber (23).

REFERENCES:
patent: 3934060 (1976-01-01), Burk et al.
patent: 4290187 (1981-09-01), Stein
patent: 4363828 (1982-12-01), Brodsky et al.
patent: 4369205 (1983-01-01), Winterling et al.
patent: 4487162 (1984-12-01), Cann
patent: 4588490 (1986-05-01), Cuomo et al.
patent: 4601781 (1986-07-01), Mercier et al.
patent: 4668365 (1987-05-01), Foster et al.
patent: 4714536 (1987-12-01), Freeman et al.
patent: 4842683 (1989-06-01), Cheng et al.
patent: 4872947 (1989-10-01), Wang et al.
patent: 4876983 (1989-10-01), Fukuda et al.
patent: 4882198 (1989-11-01), Temple et al.
"SiO.sub.2 Planarization Technology with Biasing and Electron Cyclotron Resonance Plasma Deposition for Submicron Interconnections", by K. Machida et al., Journal of Vacuum Science Technology, B4 (4), Jul./Aug. 1986, pp. 818-821.
"Sidewall-Tapered Oxide by Plasma-Enhanced Chemical Vapor Deposition", by G. C. Smith et al., Journal of Electrochemical Society: Solid-State Science and Technology, vol. 132, No. 11, Nov. 1985, pp. 2721-2725.
"Study of Planarized Sputter-Deposited SiO.sub.2, " C. Y. Ting et al., Journal of Vacuum Science Technology, 15(3), May/Jun. 1978, pp. 1105-1112.
Sze, S., VLSI Technology, p. 107, McGraw-Hill, 1983.

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