Silicon cleaning method for semiconductor materials and...

Single-crystal – oriented-crystal – and epitaxy growth processes; – Processes of growth from liquid or supercritical state – Having pulling during growth

Reexamination Certificate

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C117S011000

Reexamination Certificate

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10928682

ABSTRACT:
A cleaning method cleans silicon for semiconductor materials using pure water treated by a reverse osmosis treatment and by ion exchange treatment and reduces the aluminum and iron remaining on the silicon surface.

REFERENCES:
patent: 6557569 (2003-05-01), Katagiri et al.
patent: 6783748 (2004-08-01), Tanaka et al.
patent: 2003-245667 (2003-09-01), None
“Silicon Chemistry”, Realize Corp., pp. 903-908.
Silicon Technologies Committee, “Standard of JEITA EM-3601”, 1974.

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