Silicon carbide single crystal and production thereof

Single-crystal – oriented-crystal – and epitaxy growth processes; – Forming from vapor or gaseous state – Fully-sealed or vacuum-maintained chamber

Reexamination Certificate

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C117S084000, C117S088000, C117S100000, C117S105000, C117S951000

Reexamination Certificate

active

07553373

ABSTRACT:
A method of producing a silicon carbide single crystal, having:fixing a seed crystal, including setting a seed crystal on a seed crystal fixing part with interposition of an adhesive; applying a uniform pressure on the entire surface of the seed crystal by contacting a flexible bag which is inflatable and deflatable to the seed crystal by charging a gas into the to flexible bag; hardening the adhesive; andsublimating a silicon carbide powder obtained by calcinating a mixture containing at least a silicon source and a resol xylene resin, having a nitrogen content of 100 mass ppm or less and having a content of each impurity elements of 0.1 mass ppm or less, and re-crystallizing for growing a silicon carbide single crystal.

REFERENCES:
patent: 4832888 (1989-05-01), Sato et al.
patent: 4866005 (1989-09-01), Davis et al.
patent: 5045298 (1991-09-01), Muramatsu et al.
patent: RE34861 (1995-02-01), Davis et al.
patent: 5863325 (1999-01-01), Kanemoto et al.
patent: 5873937 (1999-02-01), Hopkins et al.
patent: 6013236 (2000-01-01), Takahashi et al.
patent: 6025289 (2000-02-01), Carter et al.
patent: 6218680 (2001-04-01), Carter et al.
patent: 6280496 (2001-08-01), Kawai et al.
patent: 6406539 (2002-06-01), Shigeto et al.
patent: 2002/0165078 (2002-11-01), Otsuki et al.
patent: 06-316499 (1994-11-01), None
patent: 07-157307 (1995-06-01), None
patent: 09-268099 (1997-10-01), None
patent: 10-182296 (1998-07-01), None
patent: 10-291899 (1998-11-01), None
patent: 2000-503968 (2000-04-01), None
patent: 00/39372 (2000-07-01), None
patent: WO 00/71787 (2000-11-01), None
Hobgood et al, “Status of Large Diameter SiC Crystal Growth for Electronic and Optical Applicaionts,”Materials Science Forum, vols. 338-342 (2000), pp. 3-8.
Snyder et al., “Large Diameter PVT Growth of Bulk 6H SiC Crystals,”Materials Science Forum, vols. 338-342 (2000), pp. 9-12.
Patent Abstracts of Japan. English Abstract of JP 11-109639 (1999).
Office Action Dated Oct. 30, 2007 for JPA 2002-158938, Japanese Patent Office.
Japanese Office Action dated Feb. 12, 2008.

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