Active solid-state devices (e.g. – transistors – solid-state diode – Specified wide band gap semiconductor material other than... – Diamond or silicon carbide
Reexamination Certificate
2006-02-28
2006-02-28
Flynn, Nathan J. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Specified wide band gap semiconductor material other than...
Diamond or silicon carbide
C257S076000, C257S133000, C257S134000, C438S133000, C438S136000, C438S931000
Reexamination Certificate
active
07005678
ABSTRACT:
A silicon carbide semiconductor device includes: a semiconductor substrate including a base substrate, a first semiconductor layer, a second semiconductor layer and a third semiconductor layer, which are laminated in this order; a cell portion disposed in the semiconductor substrate and providing an electric part forming portion; and a periphery portion surrounding the cell portion. The periphery portion includes a trench, which penetrates the second and the third semiconductor layers, reaches the first semiconductor layer, and surrounds the cell portion so that the second and the third semiconductor layers are divided by the trench substantially. The periphery portion further includes a fourth semiconductor layer disposed on an inner wall of the trench.
REFERENCES:
patent: 5233215 (1993-08-01), Baliga
patent: 2003/0096464 (2003-05-01), Lanois
Kumar Rajesh
Mihaila Andrei
Udrea Florin
Denso Corporation
Flynn Nathan J.
Posz Law Group , PLC
Quinto Kevin
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