Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1985-02-25
1986-12-30
Arnold, Bruce Y.
Optics: measuring and testing
By particle light scattering
With photocell detection
350 11, 350171, G01J 345, G02B 2714
Patent
active
046325530
ABSTRACT:
An interferometer spectrometer having a source of infrared analytical radiation, a fixed reflector, a moving reflector and a beam splitter for directing the analytical radiation to the reflectors. The beam splitter is formed of a semiconductor material which, in a preferred embodiment, is silicon. In a preferred physical embodiment, the beam splitter is configured as a wedge.
REFERENCES:
patent: 4278351 (1981-07-01), Frosch
Wolfe, W. L. et al, (editor) "The Infrared Handbook" Environmental Research Institute of Michigan, pp. 7-17.
Anderson Charles R.
Vidrine D. Warren
Arnold Bruce Y.
Nicolet Instrument Corporation
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