Silicide-interface polysilicon resistor

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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Details

C257SE21004, C257SE29326, C438S384000

Reexamination Certificate

active

08076754

ABSTRACT:
A silicide-interface polysilicon resistor is disclosed. The silicide-interface polysilicon resistor includes a substrate, an oxide layer located on top of the substrate, and a polysilicon layer located on top of the oxide layer. The polysilicon layer includes multiple semiconductor junctions. The silicide-interface polysilicon resistor also includes a layer of silicide sheets, and at least one of the silicon sheets is in contact with one of the semiconductor junctions located within the polysilicon layer.

REFERENCES:
patent: 5847988 (1998-12-01), Babson et al.
patent: 6088256 (2000-07-01), Worley et al.
patent: 6429492 (2002-08-01), Rockett
patent: 6580156 (2003-06-01), Ito et al.
patent: 7148556 (2006-12-01), Shaw et al.
patent: 2006/0120143 (2006-06-01), Liaw
patent: 2007/0026579 (2007-02-01), Nowak et al.
patent: 2007/0099326 (2007-05-01), Hsu et al.
Quirk et al., “Characteristics of Semiconductor Materials,” Semiconductor Manufacturing Technology, Prentice Hall, 2001, pp. 33-39.

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