Glass manufacturing – Processes – With shaping of particulate material and subsequent fusing...
Reexamination Certificate
2006-08-01
2006-08-01
Vincent, Sean (Department: 1731)
Glass manufacturing
Processes
With shaping of particulate material and subsequent fusing...
C065S031000, C065S032100, C065S033100
Reexamination Certificate
active
07082789
ABSTRACT:
A silica glass member for semiconductor in which each concentration of Fe, Cu, Cr and Ni is 5 ppb or less and the concentration of an OH group is 30 ppm or less and which has a viscosity of 1013.0poise or more at 1200° C. is provided as a silica glass member for semiconductor having high heat-resistance and higher purity.
REFERENCES:
patent: 4-046020 (1992-02-01), None
patent: 8-081226 (1996-03-01), None
patent: 8-165131 (1996-06-01), None
patent: 8-183621 (1996-07-01), None
patent: 10-114532 (1998-05-01), None
patent: 2001-089161 (2001-04-01), None
patent: 2001-151531 (2001-06-01), None
Ezaki Masanobu
Pan Lian-Sheng
Taniike Seiji
Foley & Lardner LLP
Toshiba Ceramics Co. Ltd.
Vincent Sean
LandOfFree
Silica glass member for semiconductor and production method... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Silica glass member for semiconductor and production method..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Silica glass member for semiconductor and production method... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3667750