Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1996-11-14
1998-05-05
Nelms, David C.
Optics: measuring and testing
By particle light scattering
With photocell detection
356349, 356352, G01B 902
Patent
active
057483132
ABSTRACT:
The signal-to-noise ratio of the correction signal used for second harmonic interferometry is improved in two ways. First, an optical amplifier, tuned to the second harmonic frequency, is positioned in the optical path. Second, a doubling stage is positioned internal to the correction laser.
REFERENCES:
patent: 5404222 (1995-04-01), Lis
Stepper Overlay Performances Measurements Using the Air Turbulence Compensated Interferometer by Philip D. Henshaw, Sparta, Inc., proceedings of the SPIE (The International Society for Optical Engineering Conference), vol. 2726, pp. 809-820, Mar. 13-15, 1996.
Hewlett--Packard Company
Kee Pamela Lau
Merlino Amanda
Nelms David C.
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