Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves
Patent
1976-03-29
1977-11-08
Tokar, M.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Analysis of complex waves
324 78D, G01R 2316
Patent
active
040577562
ABSTRACT:
In a spectrum analyzer, the analogue signal to be analyzed is periodically sampled and digitized, and the digit samples are formed into R successive arrays each containing 2N successive samples and each overlapping the previous array by 50%. The forward Fourier transforms of each array are then successively formed, and an array of 2P complex points is formed from the result of each transform, where L-P/2 and L+P/2-1 are the points which represent the upper and lower limits of a Vernier band to be studied in detail and each array extends from points L-P to L+P-1 (i.e. each array is twice the width of the Vernier band, and the Vernier band is symmetrically disposed therein): additionally, each array for which L and R are odd is complemented. The arrays thus formed are then each multiplied by a window function (effectively equivalent to a band pass filter), and the result is subjected to the inverse Fourier transform to form respective further arrays of 2P points. The central points (from P/2 to 3P/2-1) of each of these further arrays are allowed to build up into a continuous array, and the M most recent points, where M is twice the required number of points in the Vernier band, are subjected to the forward Fourier transform to form M complex points, of which the middle points (from M/4 to 3M/4-1) are the desired result.
This analyzer has the advantage that the Vernier band can be digitally positioned anywhere in the frequency band covered by the first forward Fourier transform.
Jeffery Michael Cedric
Ley Anthony John
Metcalf Eric
McMahon Kevin
Novack Martin M.
Sherman William R.
The Solartron Electronic Group Ltd.
Tokar M.
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