Signal processor and apparatus and method for testing same

Details Signal processor and apparatus and method for testing same Signal processor and apparatus and method for testing same

2005-07-12

2005-07-12

JeanPierre, Peguy (Department: 2819)

Coded data generation or conversion

Analog to or from digital conversion

Analog to digital conversion

C341S143000

Reexamination Certificate

active

06917324

ABSTRACT:
An apparatus for testing a signal processor includes an integrator and a control section. The integrator switches an input signal in response to a first clock signal to allow the input signal to be charged in at least one capacitive element, and outputs the charged input signal in response to a second clock signal. The control section is coupled to the integrator, and provides the integrator with a control signal to discharge the capacitive elements based on a level of the input signal at a previous part of a test mode. The time required for testing the signal processor is reduced.

REFERENCES:
patent: 3683369 (1972-08-01), Stern
patent: 6037887 (2000-03-01), Wu et al.
patent: 6184811 (2001-02-01), Nagari et al.

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