Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-10-31
2010-02-16
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S057000, C702S064000, C702S082000
Reexamination Certificate
active
07664612
ABSTRACT:
First and second complementary voltage signals are operatively coupled across a series circuit comprising first and second sense resistors and a circuit element therebetween. An output signal responsive to the self-impedance of the circuit element is generated responsive at least one of a voltage across the first sense resistor and a voltage across the second sense resistor, and at least one of the first and second complementary voltage signals is controlled responsive to the output signal so as to provide for attenuating at least one noise signal having a frequency that is substantially different from a frequency of the first and second complementary voltage signals.
REFERENCES:
patent: 3448378 (1969-06-01), Roveti
patent: 3835371 (1974-09-01), Mirdadian
patent: 3848243 (1974-11-01), Schirmer
patent: 3870948 (1975-03-01), Holt et al.
patent: 4630229 (1986-12-01), D'Hondt
patent: 4651093 (1987-03-01), Detriche' et al.
patent: 4655312 (1987-04-01), Frantom et al.
patent: 5020541 (1991-06-01), Marriott
patent: 5182513 (1993-01-01), Young et al.
patent: 5197479 (1993-03-01), Hubelbank et al.
patent: 5629619 (1997-05-01), Mednikov
patent: 5707076 (1998-01-01), Takahashi
patent: 5792956 (1998-08-01), Li
patent: 5895071 (1999-04-01), Norton
patent: 6005392 (1999-12-01), Patzwaldt
patent: 6208534 (2001-03-01), Shteynberg et al.
patent: 6246230 (2001-06-01), Mednikov
patent: 6252393 (2001-06-01), Hedengren
patent: 6288536 (2001-09-01), Mandl et al.
patent: 6317048 (2001-11-01), Bomya et al.
patent: 6407660 (2002-06-01), Bomya
patent: 6433688 (2002-08-01), Bomya
patent: 6445171 (2002-09-01), Sandquist et al.
patent: 6479990 (2002-11-01), Mednikov et al.
patent: 6510062 (2003-01-01), Goder et al.
patent: 6552662 (2003-04-01), Bomya et al.
patent: 6566856 (2003-05-01), Sandquist et al.
patent: 6583616 (2003-06-01), Bomya
patent: 6586926 (2003-07-01), Bomya
patent: 6587048 (2003-07-01), Bomya
patent: 6631776 (2003-10-01), Bomya
patent: 6777927 (2004-08-01), Bomya
patent: 7113874 (2006-09-01), Watson et al.
patent: 7164349 (2007-01-01), Kawaura et al.
patent: 7190161 (2007-03-01), Bomya
patent: 7209844 (2007-04-01), Merrick et al.
patent: 7212895 (2007-05-01), Cech et al
patent: 7388370 (2008-06-01), Cech et al.
patent: 7463987 (2008-12-01), Cech et al.
patent: 2004/0056652 (2004-03-01), Bomya
patent: 2005/0093540 (2005-05-01), Merrick et al.
patent: 2005/0096815 (2005-05-01), Takafuji et al.
patent: 2005/0096881 (2005-05-01), Watson et al.
patent: 2005/0099278 (2005-05-01), Kawaura et al.
patent: 2005/0127908 (2005-06-01), Schlicker et al.
patent: 2005/0143944 (2005-06-01), Cech et al.
patent: 2005/0154530 (2005-07-01), Hosokawa et al.
patent: 2007/0024277 (2007-02-01), Cech et al.
patent: 2007/0188168 (2007-08-01), Stanley et al.
patent: 2008/0068008 (2008-03-01), Watson et al.
patent: 2008/0106273 (2008-05-01), Bauer et al.
patent: 2008/0109177 (2008-05-01), Cech et al.
patent: 2008/0109189 (2008-05-01), Bauer et al.
patent: 2008/0211646 (2008-09-01), Cech et al.
patent: 2009/0001976 (2009-01-01), Cech et al.
Leonard S. Cech et al., U.S. Appl. No. 11/530,492, filed Sep. 11, 2006: Non-Final Rejection on Mar. 18, 2008 with List of references cited by examiner and Lists of References cited by applicant and considered by examiner; Applicant reply dated Jul. 19, 2008 with claims; Notice of Allowance mailed on Sep. 8, 2008, 38 pp.
Leonard S. Cech et al., U.S. Appl. No. 11/930,134, filed Oct. 31, 2007: Application as filed with Application Data Statement, Oath or Declaration and EFS Acknowledgement Receipt, 189 pp.
Office Action in U.S. Appl. No. 11/930,157, mailed on Jan. 5, 2009, including list of references cited by Examiner, Bibliographic Data Sheet, Issue Information, and Search information, Examiner's Search Strategy and Lists of References cited by applicant and considered by Examiner 42 pp.
Sedra, Adel S. and Smith, Kenneth C., in Microelectronic Circuits, Third Edition, Oxford University Press, 1991, Section 11.6, pp. 792-799 (8 pp.).
Kitchen et al., “A Designer's Guide to Instrumentation Amplifiers, 2nd Edition,” Analog Devices Inc., 2004.
Maxim, “Demystifying Sigma-Delta ADCs,” Dallas Semiconductor, Maxim, Application Note APP 1870, Jan. 31, 2003.
Carter, B., “A Single-Supply Op-Amp Circuit Collection,” Texas Instruments, Application Report SLOA058, Nov. 2000, 27 pp.
National Semiconductor, “An Applications Guide for Op Amps,” National Semiconductor Corporation, Applicatino Note 20, Feb. 1969, 12 pp.
Widlar, R.J., “Monolithic Op Amp—The Unversal Linear Component,” National Semiconductor Corporation, Application Note 4, Apr. 1968, 10 pp.
NDT Resource Center, Internet web pages at http://www.ndt-ed.org/EducationResources/CommunityCollege/ EddyCurrents/cc—ec—index.htm, NDT Resource Center, downloaded on Oct. 13, 2005.
Buckley, J.M., “An Introduction to Eddy Current Testing theory and technology,”, technical paper eddyc.pdf available from the internet at http://joe.buckley.net/papers, downloaded on Sep. 8, 2003.
Office Action in U.S. Appl. No. 11/930,150, mailed on Jan. 13, 2009, including list of references cited by Examiner, Index of Claims, Bibliographic Data Sheet, Issue Information, Search information, Examiners Search Strategy and Lists of References cited by applicant and considered by Examiner 40 pp.
Baal James D.
Bauer Scott E.
Feliciano Eliseo Ramos
Raggio & Dinnin, P.C.
Suarez Felix E
T K Holdings, Inc.
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