Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2006-05-23
2006-05-23
Lauchman, Layla G. (Department: 2877)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C356S445000, C250S573000
Reexamination Certificate
active
07050949
ABSTRACT:
A signal processing method and a signal processing device are provided in which a signal obtained from an object as an input signal, a time lag signal is generated from the input signal, a difference between the input signal and the time lag signal, and the generation of the difference is detected, so that a portion of the object at a position where the difference is generated is featured.
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Kokuryo Kazuto
Nagao Shinji
Lauchman Layla G.
Niles Co., Ltd.
Valentin, II Juan D.
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