Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-06-21
2005-06-21
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C375S224000
Reexamination Certificate
active
06909978
ABSTRACT:
In the process of estimating attributes of a transmission line from reflectometry measurements, small yet important reflections may be drowned in the immediate reflected signal owing to the mismatch between the reference impedance with respect to which the 1-port scattering parameter of the line has been determined and the characteristic impedance of the line.The major part of the near-end reflections are eliminated by estimating the characteristic impedance of the line, and by converting the 1-port scattering parameter of the line from the reference impedance base to the estimated characteristic impedance base.However, there is still a residual influence of the near-end reflections. It is then highly necessary to determine a time zone wherein the residual near-end reflections are enclosed so as their contribution is further neutralized in the process of estimating attributes of the transmission line.
REFERENCES:
patent: 6081125 (2000-06-01), Krekels et al.
patent: 6205220 (2001-03-01), Jacobsen et al.
patent: 6263047 (2001-07-01), Randle et al.
patent: 6421624 (2002-07-01), Nakayama et al.
patent: 2002/0186760 (2002-12-01), Bostoen et al.
patent: 2003/0099350 (2003-05-01), Bostoen et al.
patent: 2003/0198305 (2003-10-01), Taylor et al.
patent: 2004/0022368 (2004-02-01), Bostoen et al.
patent: 2004/0196158 (2004-10-01), Sugaya et al.
patent: 1 248 383 (2002-10-01), None
patent: WO 01/01158 (2001-01-01), None
Boets P et al: “Non-parametric calibration of a time domain reflectometer”, Instrumentation and measurement Technology Conference, 1994. IMTC/94. Conference Proceedings. 10thAniversary. Advanced Technologies in I & M., 1994 IEEE Hamamatsu, Japan May 10-12 1994, New York, NY, USA, IEEE, pp. 114-117 XP010122026.
Bostoen T. et al: “Estimation of the transfer Function of a Subscriber Loop by means of a 1-Port Scattering Parameter Measurement at the Central Office”, Journal of Selected Areas in Communications (J-SAC), Jun. 2002, pp. 1-14.
Boets Patrick Jan Maria
Bostoen Tom
Pollet Thierry
Van Biesen Leonard Pierre
Alcatel
Sughrue & Mion, PLLC
Tsai Carol S. W.
LandOfFree
Signal pre-processing for estimating attributes of a... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Signal pre-processing for estimating attributes of a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Signal pre-processing for estimating attributes of a... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3511030