Signal measurement apparatus, signal measurement method,...

Details Signal measurement apparatus, signal measurement method,... Signal measurement apparatus, signal measurement method,...

2011-05-17

2011-05-17

Bui, Bryan (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S189000

Reexamination Certificate

active

07945403

ABSTRACT:
Provided is a signal measurement apparatus, including sampling sections that each sample a signal under measurement having a cycle T with a threshold value, where the threshold values of at least two of the sampling sections are different from each other; a waveform reconfiguring section that shapes a reconfigured waveform having the cycle T by rearranging ordinal ranks of sample values corresponding to each threshold value obtained by the sampling sections, a distribution generating section that generates a timing distribution of edges in the reconfigured waveform corresponding to each threshold value; and a calculating section that calculates rise time or fall time of the signal under measurement based on the timing distribution corresponding to each threshold value.

REFERENCES:
patent: 7421355 (2008-09-01), Hou et al.
patent: 7715512 (2010-05-01), Ichiyama et al.
patent: 2002228687 (2002-08-01), None

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