Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-15
2008-04-15
Tang, Minh N (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
11276929
ABSTRACT:
A differential signal probe-differential signal launch structure wherein the conductive outer housing of the differential signal probe is disposed on and electrically connected to a conductive ground pad disposed on a printed circuit board. A vertically extending ground via is provided with the conductive pad being electrically connected to the horizontally ground plane conductors through the vertically extending ground via.
REFERENCES:
patent: 5221895 (1993-06-01), Janko et al.
Pritchard Jason
Ramroopsingh Marlon
EMC Corporation
Tang Minh N
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