Signal generator for generating test mode signals

Details Signal generator for generating test mode signals Signal generator for generating test mode signals

1997-01-23

1998-07-28

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

327142, 327198, 327530, G05F 316, H03L 100

Patent

active

057867160

ABSTRACT:
A signal generator for generating test mode signals when any voltage higher than a recommended input high voltage is applied to a predetermined input pin, and for switching from a normal mode to a test mode in response to the test mode signals. A high impedance circuit is coupled between the input pin and a first node. The high impedance circuit comprises a plurality of transistors, the plurality of transistors respectively being connected in series and respectively having a gate coupled with a source or a drain. A signal amplifier is coupled with the high impedance circuit through the first node. A resistor is coupled between the first node and a reference voltage. A transistor is coupled between the first node and a second node between predetermined transistors among the plurality of transistors. The transistor bypasses a current path from the second node to the first node and maintains a potential level of the first node, in response to an output condition of the signal amplifier.

REFERENCES:
patent: 5327072 (1994-07-01), Savignac et al.

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