Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2011-04-05
2011-04-05
Lau, Tung S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07920979
ABSTRACT:
A signal generation circuit that uses a waveform generation mechanism to generate predetermined waveform(s) when triggered. A triggering mechanism is configured to repeatedly trigger the waveform generation mechanism at times that are dependent on data provided by a data source. The predetermined waveform may be a bandwidth-limited pulse, but might also be a rising edge or a falling edge of a pulse. Various consecutive waveforms may be summed together to thereby formulate a continuous signal. The waveform may have particular characteristics by design.
REFERENCES:
patent: 6963616 (2005-11-01), Chan
patent: 2006/0022730 (2006-02-01), Li
patent: 1416632 (2004-05-01), None
Horsky Pavel
Kamenický Petr
Hightower Robert F.
Lau Tung S
Semiconductor Components Industries LLC
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