Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-06
2005-09-06
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S060000, C324S076410
Reexamination Certificate
active
06941237
ABSTRACT:
A method, apparatus, and system for detecting a signal of interest. According to some embodiments, a power of a frequency component of a signal is determined. The power is accumulated for the long and short term, and a delta integrated power spectrum (e.g., a difference between the accumulated power for the long-term and the accumulated power for the short-term) is found. A high delta integrated power spectrum and a normalized delta integrated power spectrum may also be found. It may then be determined whether the high delta integrated power spectrum represents a signal of interest by comparing the power of the high delta integrated power spectrum to the power of the normalized delta integrated power spectrum.
REFERENCES:
patent: 5627759 (1997-05-01), Bearden et al.
patent: 6094449 (2000-07-01), Komatsu
Barlow John
Buckley Maschoff & Talwalkar LLC
Intel Corporation
Walling Meagan S
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