Signal detecting method and device, and radiation image...

Details Signal detecting method and device, and radiation image... Signal detecting method and device, and radiation image...

2007-08-14

2007-08-14

Nghiem, Michael P. (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

Reexamination Certificate

active

11081661

ABSTRACT:
A signal detecting method, which employs correlated double sampling, capable of setting an appropriate baseline sampling time and improving signal-to-noise ratio of the signal. The time constant τ in the low-pass filtering by a first holding circuit, which is constructed to sample the baseline signal, and the baseline sampling time t are set at values that satisfy the relationship of t≧10×τ.

REFERENCES:
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patent: 7170082 (2007-01-01), Yamaguchi
patent: 2005/0219534 (2005-10-01), Makino
Richard L. Weisfield and N. Robert Bennett: “Electronic noise analysis of a 127 -micron pixel TFT/photodiode array”, Medical Imaging 2001: Physics of Medical Imaging, Larry E. Antonuk, Martin J. Yafffe, Eds., Proceedings of SPIE, Feb. 16, 2001, San Diego, CA, USA, vol. 4320 (Jun. 2001), pp. 209-218.

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