Signal coincidence detection circuit

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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Details

C324S656000

Reexamination Certificate

active

11408870

ABSTRACT:
Signal coincidence detection circuits and methods implemented in such circuits are disclosed. An example signal coincidence detection circuit includes a first differential transistor pair, a second differential transistor pair coupled with the first differential transistor pair and a third differential transistor pair coupled with the first differential transistor pair in parallel with the second differential transistor pair. The circuit also includes a first input signal terminal coupled with the first, second and third differential transistor pairs, wherein, in operation, the first input signal terminal receives a first input signal that is communicated to the first, second and third differential transistor pairs. The circuit further includes a second input signal terminal coupled with the first, second and third differential transistor pairs, wherein, in operation, the second input signal terminal receives a second input signal that is communicated to the first, second and third differential transistor pairs. The circuit additionally includes a current source coupled with the first differential transistor pair, where, in operation, a plurality of currents of the second and third differential transistor pairs are combined such that the combined currents indicate whether or not coincidence between the first and second input signals exists.

REFERENCES:
patent: 4602167 (1986-07-01), Yukawa
patent: 5999054 (1999-12-01), Suzuki
patent: 6252434 (2001-06-01), Nag et al.

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