Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-12-27
2010-12-28
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S183000, C702S193000, C702S198000
Reexamination Certificate
active
07860688
ABSTRACT:
A baseline processing device and method are provided for analyzing signals with uneven distributions of pulses and slow varying baselines. In one embodiment, the device includes an A/D sampling unit for sampling a digital counting signal to obtain sampled data, and a baseline extracting unit for sorting the N sampled data in the sampling sequence by magnitude and for outputting, among the N sample data, one sample data A with a value equal to the mid-value in the N sample data. A phase compensating unit with a width of M, to which a digital signal is input, outputs a sampled data B according to a FIFO sequence, wherein M=N/2. A first subtractor subtracts the sample data A from the sample data B and outputs the result as baseline removed data.
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Huang Daxin
Qi Huan
Shi Xing
Zhao Tianfeng
Christensen Kory D.
Feliciano Eliseo Ramos
Shenzhen Mindray Bio-Medical Electronics Co., Ltd.
Stoel Rives LLP
Suarez Felix E
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