Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Distributive type parameters
Reexamination Certificate
2008-07-29
2008-07-29
Gutierrez, Diego (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Distributive type parameters
C324S601000, C702S085000, C702S109000
Reexamination Certificate
active
07405575
ABSTRACT:
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that digital samples of a signal under test acquired by the system are processed for representing the impedance of a device under test. The method and apparatus calibrates the signal path to characterize transfer parameters of the device under test within a spectral domain. A reference impedance (Zref) is retrieved that is associated with the signal analysis system. The transfer parameters of the device under test and the reference impedance (Zref) are processed to effect thereby a representation of the device under test impedance (Zeq) as a function of frequency.
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Pickerd John J.
Qiu Ping
Tan Kan
Bucher William K.
Gutierrez Diego
Tektronix Inc.
Zhu John
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