Signal analysis system and calibration method

Details Signal analysis system and calibration method Signal analysis system and calibration method

2006-08-23

2008-12-02

Cosimano, Edward R (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

C702S085000, C702S086000, C702S090000, C702S104000, C702S108000, C702S109000, C702S116000, C702S189000, C708S300000, C708S314000, C708S321000

Reexamination Certificate

active

07460983

ABSTRACT:
A method and apparatus adapted to calibrate a signal path of a signal analysis system such that loading effects of the system are substantially removed from measurements of a device under test. A signal under test from the device under test is coupled to a test probe in the signal path and used with selectable impedance loads in the test probe to characterize transfer parameters of the device under test. An equalization filter in either the frequency or time domain is computed from the device under test transfer parameters for reducing in signal error attributable to the measurement loading of the device under test.

REFERENCES:
patent: 2232642 (1941-02-01), Shaw
patent: 3348034 (1967-10-01), Jensen
patent: 3381222 (1968-04-01), Gray
patent: 4890062 (1989-12-01), Haragashira
patent: 5459396 (1995-10-01), Asar
patent: 5530373 (1996-06-01), Gibson et al.
patent: 5578932 (1996-11-01), Adamian
patent: 5621331 (1997-04-01), Smith et al.
patent: 5734268 (1998-03-01), Bockelman
patent: 6064312 (2000-05-01), Weller
patent: 6105157 (2000-08-01), Miller
patent: 6331785 (2001-12-01), Swanson et al.
patent: 6351112 (2002-02-01), Felps
patent: 6499121 (2002-12-01), Roy
patent: 6501278 (2002-12-01), Arabi
patent: 6518744 (2003-02-01), Tallman et al.
patent: 6594604 (2003-07-01), Metzger et al.
patent: 6606583 (2003-08-01), Sternberg et al.
patent: 6653848 (2003-11-01), Adamian et al.
patent: 6725170 (2004-04-01), Hickman
patent: 6785625 (2004-08-01), Fan et al.
patent: 6842012 (2005-01-01), Belge et al.
patent: 6847213 (2005-01-01), Renken et al.
patent: 6863564 (2005-03-01), Kreager et al.
patent: 6973183 (2005-12-01), Garcia
patent: 7076385 (2006-07-01), Horne et al.
patent: 7098670 (2006-08-01), Cole
patent: 7173443 (2007-02-01), Asami
patent: 2001/0007091 (2001-07-01), Walter
patent: 2002/0007477 (2002-01-01), Hisada et al.
patent: 2002/0123853 (2002-09-01), Simon et al.
patent: 2003/0001587 (2003-01-01), Arabi
patent: 2004/0201383 (2004-10-01), Anderson
patent: 2005/0093554 (2005-05-01), Wang et al.
patent: 2006/0020410 (2006-01-01), Hsu et al.
patent: 2006/0111861 (2006-05-01), Horne et al.
patent: 2006/0155498 (2006-07-01), Dunsmore et al.
patent: 2006/0210022 (2006-09-01), Tan et al.
patent: 2007/0041511 (2007-02-01), Tan et al.
patent: 2007/0041512 (2007-02-01), Pickerd et al.
patent: 2007/0273389 (2007-11-01), Tan et al.
patent: 2007/0276614 (2007-11-01), Tan et al.
patent: 2007/0276622 (2007-11-01), Pickerd et al.
patent: 2008/0059092 (2008-03-01), Pupalaikis et al.
patent: 0 333 521 (1989-09-01), None
patent: 0381398 (1990-08-01), None
Godfrey Kwan, “Sensitivity Analysis of One-port Characterized Devices in Vector Network Analyzer,” Presented at 2002 NCSL International Workshop and Symposium, pp. 1-11.
Cherry Wakayama, Jeff Loyer, Correlation between VNA and TDR/TDT Extracted S-Parameters up to 20 GHz, Intel Corporation/The University of Washington, pp. 1-7.
Leonard A. Hayden, Vijai K. Tripathi, “Calibration Methods for Time Domain Network Analysis,” IEEE Transactions on Microwave Theory and Techniques, V41, N3, Mar. 1993, pp. 415-420.
T. Dhaene, L. Martens, D. De Zutter, “Calibration and Normalization of Time Domain Network Analyzer Measurements,” IEEE Transactions on Microwave Theory . . . , Apr. 1994, pp. 580-589.
Application Note, Agilent AN 1287-1, “Understanding the Fundamental Principles of Vector Network Analysis,” Aug. 2000, pp. 1-14.
Application Note, Agilent AN 154, “S-Parameter Design,” Nov. 2000, pp. 1-44.
Application Note, Anritsu, Scorpion “Embedding/De-embedding,” May 2002, pp. 1-16.
Application Note/5A-017, Maury Microwave Corporation, “LRL Calibration of Vector Network Analyzers,” 1999, pp. 1-7.
Jochen Simon, Application Note 1EZ45—0E, Rohde & Schwarz, “Virtual Embedding Networks for Vector Network Analyzer ZVR,” Sep. 23, 1998, pp. 1-12.
Technical Brief, TDA Systems, Inc., “S-parameters, Insertion and Return Loss Measurements Using TDR Oscilloscope,” 2003, pp. 1-3.
Application Note, TDA Systems, Inc., “Choosing Signal Integrity Measurement Tools: Time or Frequency Domain?,” Jan. 29, 2002, pp. 1-10.
Application Note, TDA Systems, Inc., “TDR and VNA Measurement Primer,” 2004, pp. 1-4.
U.S. Office Action, U.S. Appl. No. 11/361,558, filed Feb. 24, 2006, Confirmation No. 5839, Inventor: Kan Tan, Mailing Date Jul. 24, 2007.
U.S. Office Action, U.S. Appl. No. 11/441,733, filed May 25, 2006, Confirmation No. 1786, Inventor: Kan Tan, Mailing Date Jul. 26, 2007.
U.S. Office Action, U.S. Appl. No. 11/508,394, filed Aug. 23, 2006, Confirmation No. 2341, Inventor: Kan Tan, Mailing Date Aug. 7, 2007.
U.S. Office Action, U.S. Appl. No. 11/441,757, filed May 25, 2006, Confirmation No. 9437, Inventor: Kan Tan, Mailing Date Jul. 19, 2007.
U.S. Office Action, U.S. Appl. No. 11/441,756, filed May 25, 2006, Confirmation No. 9436, Inventor: John J. Pickerd, Mailing Date Jun. 26, 2007.
U.S. Office Action, U.S. Appl. No. 10/786,446, filed Feb. 25, 2004, Confirmation No. 4899, Inventor: John J. Pickerd, Mailing Date Sep. 27, 2007.
U.S. Office Action, U.S. Appl. No. 11/045,413, filed Jan. 27, 2004, Confirmation No. 1776, Inventor: John J. Pickerd, Mailing Date Oct. 11, 2007.

Affiliated with

Also associated with

Rating

Signal analysis system and calibration method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Signal analysis system and calibration method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Signal analysis system and calibration method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4039004