Sidewall doping technique for SOI transistors

Fishing – trapping – and vermin destroying

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

437141, 257347, H01L 21265

Patent

active

052926702

ABSTRACT:
A method of sidewall doping is described wherein the implantation of the dopant is done after the high temperature sidewall oxidation formation. Therefore, this method allows high concentrations of the dopant to be retained along the sidewall thus deceasing the corner coupling.

REFERENCES:
patent: 4634473 (1987-01-01), Swartz et al.
patent: 4675978 (1987-06-01), Swartz
patent: 4753896 (1988-06-01), Matloubian
patent: 4797721 (1989-01-01), Hsu
patent: 4879254 (1989-11-01), Tsuzuki et al.
patent: 4943837 (1990-07-01), Konishi et al.
patent: 4963502 (1990-10-01), Teng et al.
patent: 4978626 (1990-12-01), Poon et al.
patent: 5015598 (1991-05-01), Verhaar
patent: 5053345 (1991-10-01), Schnable et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sidewall doping technique for SOI transistors does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sidewall doping technique for SOI transistors, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sidewall doping technique for SOI transistors will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-152742

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.