Side scatter tomography system

Details Side scatter tomography system Side scatter tomography system

1997-07-08

1999-07-27

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Absorption

378 86, 378 87, G01N 2304

Patent

active

059303263

ABSTRACT:
An x-ray tomography system measures x-rays side-scattered by material concealed within an enveloping surface. One or more x-ray beams are incident on the enveloping surface and scattered onto collimated detectors disposed in arrays parallel to the incident x-ray beams. By varying the relative orientation of the enveloping surface with respect to the x-ray beams and measuring the x-rays side-scattered by the material concealed within the enveloping surface, the shape, density, position and composition of the contents of the enveloping surface may be mapped.

REFERENCES:
patent: 5642394 (1997-06-01), Rothschild
patent: 5696806 (1997-12-01), Grodzins et al.

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