Coating processes – With pretreatment of the base – Metal base
Reexamination Certificate
2005-05-10
2005-05-10
Hiteshew, Felisa (Department: 1765)
Coating processes
With pretreatment of the base
Metal base
C117S084000, C117S089000, C423S328200
Reexamination Certificate
active
06890600
ABSTRACT:
A refined SiC single crystal that includes a small number of defects is provided as follows. At a first growth step, a first seed crystal is formed from a crude SiC single crystal, and a first grown crystal is formed on a first growth surface, which is a plane having an inclination of 20 degrees or smaller from a {1-100} plane or an inclination of 20 degrees or smaller from a {11-20} plane. At an intermediate growth step, an n growth crystal is formed on an n growth surface, which is a plane having an inclination of 45 to 90 degrees from an (n−1) growth surface and an inclination of 60 to 90 degrees from a {0001} plane. At a final growth step, a final SiC single crystal is formed on a final growth surface, which has an inclination of 20 degrees or smaller from a {0001} plane.
REFERENCES:
patent: 5958132 (1999-09-01), Takahashi et al.
patent: A-5-262599 (1993-10-01), None
patent: A-8-143396 (1996-06-01), None
patent: H10-182297 (2004-04-01), None
Ito Tadashi
Kondo Hiroyuki
Naito Masami
Nakamura Daisuke
Denso Corporation
Hiteshew Felisa
Kabushiki Kaisha Toyota Chuo Kenkyusho
Posz Law Group , PLC
LandOfFree
SiC single crystal, method for manufacturing SiC single... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with SiC single crystal, method for manufacturing SiC single..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SiC single crystal, method for manufacturing SiC single... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3411949