Si surface cleaning for semiconductor circuits

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S689000, C438S706000, C438S906000, C257SE21224, C257SE21226, C257SE21245

Reexamination Certificate

active

07994066

ABSTRACT:
A method is disclosed for the cleaning of a Si surface at low temperatures. Oxide on the Si surface is brought into contact with Ge, which then sublimates off the surface. The Ge contamination remaining after the oxide removal is cleared away by an exposure to an alkali halide. The disclosed cleaning method may by used in semiconductor circuit fabrication for preparing surfaces ahead of epitaxial growth.

REFERENCES:
patent: 5089441 (1992-02-01), Moslehi
patent: 5403434 (1995-04-01), Moslehi
patent: 6858503 (2005-02-01), Ngo et al.
patent: 6887773 (2005-05-01), Gunn
patent: 7129184 (2006-10-01), Chang
patent: 7235492 (2007-06-01), Samoilov
patent: 7416989 (2008-08-01), Liu et al.
patent: 2006/0138566 (2006-06-01), Chakravarti et al.
patent: 2006/0169668 (2006-08-01), Samoilov
patent: 2007/0012932 (2007-01-01), Kobayakawa et al.
patent: 2009/0075447 (2009-03-01), Meunier-Beillard et al.
“Effect of Si-Ge buffer layer for low-temperature Si epitaxial growth on Si substrate by RF plasma chemical vapor deposition”, S. Suzuki et al., J. Appl. Phys. 54, 1466 (1983).
“Oxygen removal from Si via reaction with adsorbed Ge”, J. F. Morar et al., Appl. Phys. Lett. 50, 463 (1987).
“Reduction reaction of native oxide at the initial stage of GeH4chemical vapor deposition on (100)Si”, Y. Takahasi et al., Appl. Phys. Lett. 57, 599 (1990).
“Alternate surface cleaning approaches for ultra high-vacuum chemical vapor-deposition epitaxy of Si and GexSi1-x”, M. Racanelli et al., J. Electrochem. Soc. 138, 3783 (1991).
“The viability of GeH4-based in situ clean for low temperature silicon epitaxial growth”, C. L. Wang et al. , J. Electrochem. Soc. 143, 2387 (1996).
“Chemical vapour etching of Si, SiGe and Ge with HCI; applications to the formation of thin relaxed SiGe buffers and to the revelation of threading dislocations”, Y. Bogumilowicz et al., Semicond. Sci. Technol. 20, 127 (2005).
“Interaction of Ge atoms with silica surfaces”, S.K. Stanley et al., Appl. Surf. Sci. 252, 878 (2005).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Si surface cleaning for semiconductor circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Si surface cleaning for semiconductor circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Si surface cleaning for semiconductor circuits will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2620224

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.