Shrinkage compensated measuring device

Geometrical instruments – Miscellaneous – Light direction

Patent

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Details

33476, 235 61B, 235 89R, G01B 304

Patent

active

045383529

ABSTRACT:
The disclosure describes a shrinkage compensated measuring device comprising a first scale calibrated in units of length, e.g., inches or centimeters, and a second scale calibrated in units of percent shrinkage. Each point on the second scale corresponds to a unique point on the first scale and indicates the percent difference between a reference point on the first scale and the unique point on the first scale. The shrinkage device also comprises a first array of lines, each line of the first array corresponding to a unique percent shrinkage, and a second array of lines extending across the first array such that the distance between any two lines of the second array as measured along one of the lines of the first array is inversely proportional to one minus the percent shrinkage corresponding to that line of the first array divided by one hundred.

REFERENCES:
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Wulff, J. et al., Metallurgy for Engineers: Casting, Welding and Working, John Wiley & Sons, New York, 1952, pp. 270-272.
Advertising Material for a Shrink Rule, Creative Industries, 5366 Jackson Drive, LaMesa, California, 92041, (no date).

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