Shorts testing technique reducing phantom shorts problems

Electricity: measuring and testing – Plural – automatically sequential tests

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Details

324 62, 324537, G01R 3102, G01R 2702

Patent

active

047852356

ABSTRACT:
This shorts test method reduces the occurence of phantom shorts and also in those cases where phantom shorts occur, reduces the time required to eliminate the phantom shorts. When an unexpected open or short occurs or when an expected open or short does not occur, the test is repeated either until the phantom result ceases or until a sufficient time has elapsed that the result is real rather than a transient response. Test points are arranged in an order which decreases monotonically with the parallel impedance of all elements connected directly to that test point. This reduces the rate of occurance of phantom shorts caused by parallel inpedances below the shorts threshold even though none of the individual impedances is below the shorts threshold.

REFERENCES:
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patent: 2732491 (1956-01-01), Jeannot
patent: 3032191 (1962-05-01), Clukey
patent: 3369177 (1968-02-01), Graham et al.
patent: 4290013 (1981-09-01), Thiel
patent: 4342959 (1982-08-01), Skilling

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