Short-wire bed-of-nails test fixture

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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Details

324 73PC, 324158P, G01R 104, G01R 1073

Patent

active

048034240

ABSTRACT:
A test fixture for automatic testing equipment including short wire interface assembly which permits the interface assembly to be hard wired to a test head assembly with relative short interconnect wires. The interface SW assembly includes a base cover plate having a plurality of cavities formed therein, a plurality of individual interface strips having flexible vacuum seals affixed thereto and interface contacts disposed therethrough, and a plurality of floating captive contacts disposed in the base cover plate to provide mechanical and electrical interfacing between the interface contacts and spring-loaded probes electrically connected to the ATE. The individual interface strips are readily positionable adjacent the test head assembly and rotatable to facilitate hard wiring. The hard wired interface strips are suspended in respective cavities of the base cover plate with the flexible vacuum seals in contact with a surface of the base cover plate. Vacuum pressure applied to one surface of the base cover plate effects sealing engagement between the vacuum seals and the base cover plate. Movement of the floating captive contacts is limited, thereby limiting the deflection of the individual interface strips. The flexible vacuum seals are load-insensitive, that is, the deflection of the interface strips causes a limited flexure in the flexible vacuum seals insufficient to disrupt the atmospheric pressure induced sealing contact between the flexible vacuum seals and the base cover plate.

REFERENCES:
patent: 4232928 (1980-11-01), Wickersham
patent: 4357062 (1982-11-01), Everett
patent: 4636026 (1987-01-01), Cooney et al.
"Semiconductor Chip-Sensing Device", by Lipschutz, IBM Tech. Disc. Bull., 6/1966, vol. 9, #1, pp. 100-101, 324-158F.

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