Short detector for PROMS

Details Short detector for PROMS Short detector for PROMS

1983-12-22

1986-06-17

Krawczewicz, Stanley T.

Electricity: measuring and testing

Plural, automatically sequential tests

324 51, G01R 1512

Patent

active

045958750

ABSTRACT:
Test circuitry is included in a PROM memory for detecting shorts between bit lines and word lines and shorts or leaks in a memory cell. The circuitry enables a selected positive voltage to be applied across all memory cells in the memory so that the existance of leaky memory cells or shorts in the memory can be detected during testing. The test circuitry has no appreciable effect on the memory during normal operation of the memory.

REFERENCES:
patent: 3712537 (1973-01-01), Carita
patent: 4191996 (1980-03-01), Chesley
patent: 4502131 (1985-02-01), Giebel
patent: 4503538 (1985-03-01), Fritz

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