Short detector for PROMS

Details Short detector for PROMS Short detector for PROMS

1986-02-14

1987-10-20

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of ground fault indication

324 73PC, 371 20, 371 21, G01R 3102, G06F 1100

Patent

active

047016957

ABSTRACT:
Test circuitry is included in a PROM memory for detecting shorts between bit lines and word lines and shorts or leaks in a memory cell. The circuitry enables a selected positive voltage to be applied across all memory cells in the memory so that the existence of leaky memory cells or shorts in the memory can be detected during testing. The test circuitry has no appreciable effect on the memory during normal operation of the memory.

REFERENCES:
patent: 3712537 (1973-01-01), Carita
patent: 4191996 (1980-03-01), Chesley
patent: 4502131 (1985-02-01), Giebel
patent: 4503538 (1985-03-01), Fritz
patent: 4519076 (1985-05-01), Priel et al.
Logue et al, Programmable Logic Array Error Detection and Error Correction, Jul. 1976, IBM Tech. Disc. Bul., vol. 19, No. 2, pp. 588-589.

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