Short detection circuit and short detection method

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location

Reexamination Certificate

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Details

C324S522000, C324S527000, C324S765010, C324S1540PB, C438S014000

Reexamination Certificate

active

11144013

ABSTRACT:
A circuit and method for judging a latent short-circuit defect, also known as a short-circuit defect with time passing, in the case of a high voltage system. A detection-dedicated wiring for detecting a short-circuit defect is provided between a first high voltage system wiring and a second high voltage wiring. A power supply and an ammeter is connected in series and one end of it is connected to the high voltage system wiring and the other end of it is connected to the detection-dedicated wiring. If a current value us higher than a predetermined value when the power supply is turned on, one can judge that the circuit has a high possibility of the latent short-circuit defect.

REFERENCES:
patent: 5877631 (1999-03-01), Takahashi
patent: 6107926 (2000-08-01), Kifuku et al.
patent: 6693446 (2004-02-01), Song et al.
patent: 2002/0089345 (2002-07-01), Doong et al.
patent: H06-29364 (1994-02-01), None
patent: H11-23668 (1999-01-01), None
patent: 2004-14694 (2004-01-01), None

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