Electricity: measuring and testing – Conductor identification or location – Inaccessible
Patent
1983-10-12
1986-08-19
Strecker, Gerard R.
Electricity: measuring and testing
Conductor identification or location
Inaccessible
148DIG102, G01R 2726
Patent
active
046072136
ABSTRACT:
An aligner for aligning a mask and a wafer during photolithography of a semiconductor chip uses detection of the differential capacitance between two sets of conductive fingers on the mask and ridges on the wafer. An A.C. signal is applied to the ridges and the phase or amplitude of the signals coupled to the two sets of fingers is detected and compared. A shield is positioned between the ridges and the fingers to ensure that coupling occurs only between desired portions of the ridges and the fingers.
REFERENCES:
patent: 3938113 (1976-02-01), Dobson et al.
Eaton Steven G.
Neukermans Armand P.
Cole Stanley Z.
Harvey Jack B.
McClellan William R.
Strecker Gerard R.
Varian Associates Inc.
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