Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1993-06-29
1994-08-23
Turner, Samuel A.
Optics: measuring and testing
Material strain analysis
By light interference detector
356353, G01B 902
Patent
active
053412044
ABSTRACT:
Method and apparatus for analyzing the deformation of an object resulting from the application of stress. A novel optical element is used to perform shearometric analysis upon a test object. The novel optical element has an overall pattern of first and second pluralities of regions having significantly different indices of transmissivity. The pattern of variations causes pairs of light rays which are reflected from two distinct points on the test object at a divergent angle to emerge from the optical element so that they are nearly parallel. The nearly parallel rays are then received upon a photoelectrical sensing means such as a video camera or photoelectric array. Because the rays impinging thereon are nearly parallel, they may be adequately resolved by the photoelectric sensing means, thus enabling shearometric analysis to be performed electronically in a rapid and cost-effective manner.
REFERENCES:
patent: 4690552 (1987-09-01), Grant et al.
patent: 4887899 (1989-12-01), Hung
Grant Ralph M.
Wright Forrest
Grant Engineering, Inc.
Kim Robert
Turner Samuel A.
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