Shaping ATE bursts, particularly in gallium arsenide

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor

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327165, 371 27, G01R 3128, H03K 501

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055811779

ABSTRACT:
An improved ATE and methods are provided by forming and comparing pattern bursts digitally in gallium arsenide IC's. A desired burst waveform at the DUT terminal is facilitated by setting into timing generators between bursts in effect a plurality of period waveforms constituting a palate from which by successive choice the DUT-terminal driver and comparator waveforms may be built up, each period driver waveform including a predetermined number (including zero) of rising or falling edges, any particular such edge in any particular period driver waveform being provided by the timing generators and each period comparator waveforms including voltage levels to be compared and edges provided through the timing generators, the timing generators being settable only between bursts, selection of desired palette waveforms being provided for each period by a pattern memory.

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Inspec Abstract No. B9305-2570H-002, Chakrabarti, N. B., "GaAs Integrated Circuits", Journal of the Institution of Electronics and Telecommunication Engineers, vol. 38, No. 2-3, pp. 163-178, published Mar.-Jun. 1992.

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