Geometrical instruments – Gauge – Having a movable contact probe
Reexamination Certificate
2011-08-30
2011-08-30
Guadalupe, Yaritza (Department: 2841)
Geometrical instruments
Gauge
Having a movable contact probe
C033S559000
Reexamination Certificate
active
08006402
ABSTRACT:
A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle θ of the stylus displacement vector D that is caused by a frictional force between a stylus32and the measuring surface5aduring scanning of the measuring surface5aby the stylus32. The stylus displacement vector D is a vector including a quantity and a direction of position displacement of the stylus32relative to the probe5. Movement of an XY-stage7is controlled so that the probe6moves in accordance with the moving vector M.
REFERENCES:
patent: 2858071 (1958-10-01), Stokes
patent: 5345689 (1994-09-01), McMurtry et al.
patent: 6026583 (2000-02-01), Yoshizumi et al.
patent: 6701267 (2004-03-01), Noda et al.
patent: 6701633 (2004-03-01), Ohtsuka
patent: 7065893 (2006-06-01), Kassai et al.
patent: 7328518 (2008-02-01), Taniuchi et al.
patent: 7389594 (2008-06-01), Takahashi
patent: 7918036 (2011-04-01), Ishikawa
patent: 2002/0148130 (2002-10-01), Ohtsuka
patent: 2005/0111725 (2005-05-01), Noda et al.
patent: 2005/0155242 (2005-07-01), Kadowaki et al.
patent: 2005/0204573 (2005-09-01), Kassai et al.
patent: 2005/0263727 (2005-12-01), Noda
patent: 2005/0278968 (2005-12-01), Takahashi
patent: 2006/0117587 (2006-06-01), Lotze
patent: 2009/0299692 (2009-12-01), Yoshizumi et al.
patent: 2009/0300930 (2009-12-01), Ishikawa
patent: 1704718 (2005-12-01), None
patent: 57-33301 (1982-02-01), None
patent: 03-251346 (1991-11-01), None
patent: 3101322 (2000-10-01), None
patent: 2003-240538 (2003-08-01), None
patent: 2005-345123 (2005-12-01), None
patent: 2006/114567 (2006-11-01), None
Chinese Office Action issued May 11, 2010 (with English translation) in a Chinese application that is a foreign counterpart to the present application.
Doi Masateru
Kurata Takayuki
Yoshizumi Keiichi
Guadalupe Yaritza
Panasonic Corporation
Wenderoth , Lind & Ponack, L.L.P.
LandOfFree
Shape measuring apparatus and shape measuring method does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Shape measuring apparatus and shape measuring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Shape measuring apparatus and shape measuring method will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2776994