Shallow trench power MOSFET and IGBT

Chemistry: molecular biology and microbiology – Process of utilizing an enzyme or micro-organism to destroy... – Treating animal or plant material or micro-organism

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S341000

Reexamination Certificate

active

07063975

ABSTRACT:
A power semiconductor device includes a substrate having an upper surface and a lower surface. The substrate has a trench. First and second doped regions are provided proximate the upper surface of the substrate. A first source region is provided within the first doped region. A second source region is provided within the second doped region. A gate is provided between the first and second source regions. The gate includes a first portion extending downward into the trench. A depth of the trench is no more than a depth of the first doped region.

REFERENCES:
patent: 4959699 (1990-09-01), Lidow et al.
patent: 5008725 (1991-04-01), Lidow et al.
patent: 5187117 (1993-02-01), Zommer
patent: 5629543 (1997-05-01), Hshieh et al.
patent: 5629552 (1997-05-01), Zommer
patent: 5689128 (1997-11-01), Hshieh et al.
patent: 6133587 (2000-10-01), Takeuchi et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Shallow trench power MOSFET and IGBT does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Shallow trench power MOSFET and IGBT, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Shallow trench power MOSFET and IGBT will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3665229

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.