Shadow-free 3D and 2D measurement system and method

Details Shadow-free 3D and 2D measurement system and method Shadow-free 3D and 2D measurement system and method

2003-09-04

2008-03-04

Patel, Kanjibhai (Department: 2624)

Image analysis

Image enhancement or restoration

Intensity, brightness, contrast, or shading correction

C356S450000, C382S312000

Reexamination Certificate

active

07340107

ABSTRACT:
A shadow-free 3D and 2D measurement system combining, in one FMI set-up, a Moiré 3D lighting with other simultaneous external illuminations (for example a coaxial one or another). The reconstructed image combines the advantages of these different illuminations. The relative light intensities are selected in order to assure the best 2D detection while maintaining the 3D measurements.

REFERENCES:
patent: 4564295 (1986-01-01), Halioua
patent: 4646214 (1987-02-01), Mendleski
patent: 5307152 (1994-04-01), Boehnlein et al.
patent: 5612786 (1997-03-01), Huber et al.
patent: 5877507 (1999-03-01), Shinomiya
patent: 6040910 (2000-03-01), Wu et al.
patent: 6552783 (2003-04-01), Schmidt et al.
patent: 6724489 (2004-04-01), Freifeld
patent: 6841780 (2005-01-01), Cofer et al.

Affiliated with

Also associated with

Rating

Shadow-free 3D and 2D measurement system and method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Shadow-free 3D and 2D measurement system and method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Shadow-free 3D and 2D measurement system and method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3980065