Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-02-28
2006-02-28
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S120000
Reexamination Certificate
active
07006940
ABSTRACT:
A method and system are provided for testing a first integrated circuit chip which is packaged along with at least a second integrated circuit chip in a semiconductor device, wherein at least some external terminals for the semiconductor device are shared by the first and second integrated circuit chips. The method and system include: powering down the second integrated circuit chip; tri-stating a plurality of input/output (I/O) drivers of the second integrated circuit chip so that the plurality of I/O drivers do not drive any signals onto any connections for the shared external terminals; and performing testing of the first integrated circuit chip according to one or more regular testing routines.
REFERENCES:
patent: 6351681 (2002-02-01), Chih et al.
patent: 6675269 (2004-01-01), Miura et al.
patent: 6711042 (2004-03-01), Ishikawa
patent: 2002/0017720 (2002-02-01), Nishizawa et al.
patent: 2003/0235929 (2003-12-01), Cowles et al.
patent: 2004/0027150 (2004-02-01), Miura et al.
patent: 2004/0100296 (2004-05-01), Ong
patent: 2004/0150089 (2004-08-01), Inoue et al.
patent: 2004/0196709 (2004-10-01), Ong
Inapac Technology, Inc.
Sidley Austin Brown & Wood LLP
Tsai Carol S. W.
LandOfFree
Set up for a first integrated circuit chip to allow for... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Set up for a first integrated circuit chip to allow for..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Set up for a first integrated circuit chip to allow for... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3705339