Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-04-26
2005-04-26
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C356S073100
Reexamination Certificate
active
06885954
ABSTRACT:
A method and system for performing sequence time domain reflectometry over a communication channel to determine the location of line anomalies in the communication channel is disclosed. In one embodiment, the system generates a sequence signal and transmits the sequence signal over an optical channel. The system receives one or more reflection signals over the optical channel and performs reflection signal processing on the reflection signal. In one embodiment, the optical reflection is transformed to an electrical signal and correlated with the original sequence signal to generate a correlated signal. The time between the start of the reflection signal and a subsequent point of correlation and the rate of propagation reveals a line anomaly location. A circulator, beam splitter, or any other similar device may direct the reflection signal to the apparatus configured to perform reflection signal processing.
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Jones Keith R.
Jones William W.
Jonsson Ragnar H.
Treviño Gilberto Isaac Sada
Mindspeed Technologies Inc.
Raymond Edward
Weide & Miller Ltd.
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