Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-12-12
2006-12-12
Tsai, Carol S.W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S066000, C375S226000
Reexamination Certificate
active
07149638
ABSTRACT:
Random and deterministic components of jitter are separated. A measured value for deterministic jitter and a plurality of values for random jitter are used to calculate a plurality of first ratios (ξml) of random jitter to deterministic jitter. For each of the plurality of values for random jitter, the value for random jitter is convolved with the measured value for deterministic jitter and a double delta approximation is performed on the result to calculate a plurality of second ratios (ξdd) of random jitter to deterministic jitter. A double delta approximation is performed on a measured jitter distribution to obtain a ratio (ξddmeas) of random jitter to deterministic jitter. The ratio (ξddmeas) is adjusted using a relationship of the plurality of first ratios (ξml) to the plurality of second ratios (ξdd) in order to produce a corrected ratio (ξmlcorr).
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Agilent Technologie,s Inc.
Tsai Carol S.W.
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