Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-03-13
2007-03-13
Hoff, Marc S (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S181000
Reexamination Certificate
active
11104124
ABSTRACT:
A random component of jitter and a deterministic component of jitter are separated. A measured jitter distribution is obtained. A form is selected for a selected component of jitter. The selected component of jitter is either the random component of jitter or the deterministic component of jitter. A remaining component of jitter is either the random component of jitter or the deterministic component of jitter, whichever is not the selected component of jitter. The selected form for the selected component of jitter is convolved with a generalized function for the remaining component of jitter to produce a resulting equation. The resulting equation is fitted to the measured jitter distribution.
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Agilent Technologie,s Inc.
Charioui Mohamed
Hoff Marc S
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