Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-28
2011-06-28
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S537000, C324S754090, C324S754130, C324S757010, C324S758030, C324S762010
Reexamination Certificate
active
07969175
ABSTRACT:
The invention relates to an apparatus for testing an integrated circuit of an electronic device.
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Barraclough William D.
Hendrickson David S.
Jovanovic Jovan
Richmond, II Donald P.
Aehr Test Systems
Chan Emily Y
DeKlerk Stephen M.
Nguyen Ha Tran T
SNR Denton US LLP
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