Measuring and testing – Surface and cutting edge testing – Roughness
Reexamination Certificate
2005-09-22
2008-11-04
Noland, Thomas P (Department: 2856)
Measuring and testing
Surface and cutting edge testing
Roughness
C324S715000, C422S082010, C436S063000, C977S860000, C977S869000, C977S875000
Reexamination Certificate
active
07444856
ABSTRACT:
Sensors and systems for electrical, electrochemical, or topographical analysis, as well as methods of fabricating these sensors are provided. The sensors include a cantilever and one or more probes, each of which has an electrode at its tip. The tips of the probes are sharp, with a radius of curvature of less than about 50 nm. In addition, the probes have a high aspect ratio of more than about 19:1. The sensors are suitable for both Atomic Force Microscopy and Scanning Electrochemical Microscopy.
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Fasching Rainer J.
Greco Ralph S.
Hammerick Kyle
Prinz Friedrich B.
Smith Robert Lane
Lumen Patent Firm, Inc.
Noland Thomas P
The Board of Trustees of the Leland Stanford Junior University
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