Sensor utilizing attenuated total reflection

Details Sensor utilizing attenuated total reflection Sensor utilizing attenuated total reflection

2006-03-14

2006-03-14

Lee, HWA (Andrew) (Department: 2877)

Optics: measuring and testing

Of light reflection

Reexamination Certificate

active

07012693

ABSTRACT:
A sensor comprising a light source for emitting a light beam, and a measuring chip. The measuring chip includes a dielectric block transparent to the light beam, a thin film layer formed on the dielectric block, and a liquid-sample holding mechanism for holding a liquid sample. The sensor also comprises an optical system for making the light beam enter the dielectric block at an angle of incidence so that a total internal reflection condition is satisfied at an interface between the dielectric block and the thin film layer. The sensor further comprises a photodetector for detecting the intensity of the light beam totally reflected at the interface, and a measuring section for measuring a state of attenuated total reflection, based on the result of detection obtained by the photodetector. The irradiation energy of the light beam at the interface is 100 mJ/mm2or less.

REFERENCES:
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patent: 0 286 195 (1988-10-01), None
patent: 0 517 930 (1992-12-01), None
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patent: WO 00/22419 (2000-04-01), None
Spectral Research, vol. 47, No. 1, pp. 21-23 and 26-27.

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