Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2006-11-21
2006-11-21
Wachsman, Hal D. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
C702S104000, C702S107000, C702S127000
Reexamination Certificate
active
07139682
ABSTRACT:
A sensor system with variable sensor-signal processing comprises an integrated circuit sensor unit. The integrated circuit sensor unit includes a sensor element that provides a sensed signal in response to a measurement variable, and a memory device that stores adjustable coefficient values. The integrated circuit sensor units also includes a sensor signal processing unit that processes the sensed signal using adjustable coefficient values to provide a sensor output signal on a output line. The sensor system receives updated adjustable coefficient values via the output line and stores the updated adjustable coefficient values in the memory device.
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Translation of DE 197 19 633 A1.
Translation of EPO 0 048 851 B1.
Micronas GmbH
O'Shea Getz & Kosakowski P.C.
Wachsman Hal D.
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