Sensor self-test transfer standard

Measuring and testing – Instrument proving or calibrating – Speed – velocity – or acceleration

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

Reexamination Certificate

active

07543473

ABSTRACT:
A system, computer program product and method of obtaining a performance parameter associated with a sensor, such as an accelerometer, is provided. The method includes applying an acceleration to the accelerometer and a first frequency to obtain a sensitivity of the accelerometer at the first frequency. A first self-test is performed on the accelerometer. The first self-test includes stimulating the accelerometer with a first self-test stimulation signal encoded with the first frequency, such that the accelerometer outputs a first signal. A self-test equivalent acceleration is then determined based, at least in part, on the first signal and the accelerometer sensitivity at the first frequency. A second self-test is performed on the accelerometer. The second self-test includes stimulating the accelerometer with a second self-test stimulation signal encoded with the second frequency, such that the accelerometer outputs a second signal. A parameter of the accelerometer is determined at the second frequency based, at least in part, on the second signal and the self-test equivalent acceleration. The parameter may be sensitivity of the accelerometer at the second frequency.

REFERENCES:
patent: 3159037 (1964-12-01), Blitzer
patent: 3720915 (1973-03-01), Hass
patent: 4805456 (1989-02-01), Howe et al.
patent: 4950914 (1990-08-01), Kurihara et al.
patent: 5060504 (1991-10-01), White et al.
patent: 5103667 (1992-04-01), Allen et al.
patent: 5345824 (1994-09-01), Sherman et al.
patent: 6308554 (2001-10-01), Mattes et al.
patent: 6512364 (2003-01-01), Okada
patent: 6840106 (2005-01-01), McNeil
patent: 7086270 (2006-08-01), Weinberg et al.
Analog Devices, Inc. Single-Axis, High-g, iMEMS® Accelerometers, ADXL78, pp. 1-12, May 2005.
“Allen et al., Self-Testable Accelerometer Systems”,Micro Electro Mechanical Systems, Proceedings, An Investigation of Micro Structures, Sensors, Actuators, Machines and Robots, pp. 113-115, Feb. 1989.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sensor self-test transfer standard does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sensor self-test transfer standard, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sensor self-test transfer standard will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4126502

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.