Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-06-21
2008-12-30
Feliciano, Eliseo Ramos (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C324S519000
Reexamination Certificate
active
07472028
ABSTRACT:
An apparatus, system, and method for measuring parameters, measuring or determining capacitance, producing a digital output that is dependent upon a capacitance, or converting a variable capacitance output, of a sensor capacitor for example, into a digital format. By activating and deactivating pins, a microprocessor may form various circuits, for instance, each containing a resistor and a different capacitor and, in some embodiments, without the use of intermediate switching components. The microprocessor may alternately measure the time to change the charge of each of the capacitors and then calculate the capacitance of one of the capacitors using the measured times and known capacitances of one or more reference capacitors. Certain embodiments use two reference capacitors and alternately charge and discharge the capacitors, and a simple formula may be used to calculate capacitance using times to reach a threshold voltage. A measured parameter may be humidity or pressure, for example.
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Precise Impedance Measurement of Electrical Components Mar. 30, 2005 [http://www.cy-sensors.com/Impedance.htm].
Baran Mary C
Bryan Cave LLP
Feliciano Eliseo Ramos
Kele Inc.
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