Sensor or capacitance measuring with a microprocessor

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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C324S519000

Reexamination Certificate

active

07472028

ABSTRACT:
An apparatus, system, and method for measuring parameters, measuring or determining capacitance, producing a digital output that is dependent upon a capacitance, or converting a variable capacitance output, of a sensor capacitor for example, into a digital format. By activating and deactivating pins, a microprocessor may form various circuits, for instance, each containing a resistor and a different capacitor and, in some embodiments, without the use of intermediate switching components. The microprocessor may alternately measure the time to change the charge of each of the capacitors and then calculate the capacitance of one of the capacitors using the measured times and known capacitances of one or more reference capacitors. Certain embodiments use two reference capacitors and alternately charge and discharge the capacitors, and a simple formula may be used to calculate capacitance using times to reach a threshold voltage. A measured parameter may be humidity or pressure, for example.

REFERENCES:
patent: 4065715 (1977-12-01), Jaffe et al.
patent: 4465229 (1984-08-01), Kompelien
patent: 4504922 (1985-03-01), Johnson et al.
patent: 4558274 (1985-12-01), Carusillo
patent: 4563634 (1986-01-01), Lehle
patent: 4661768 (1987-04-01), Carusillo
patent: 4831325 (1989-05-01), Watson, Jr.
patent: 4853693 (1989-08-01), Eaton-Williams
patent: 5027077 (1991-06-01), Yanagisawa et al.
patent: 5235267 (1993-08-01), Schöneberg et al.
patent: 5274334 (1993-12-01), Mills
patent: 5351519 (1994-10-01), Kress
patent: 5406137 (1995-04-01), Scheler et al.
patent: 5621669 (1997-04-01), Bjornsson
patent: 5841641 (1998-11-01), Faulk
patent: 5922939 (1999-07-01), Cota
patent: 5933102 (1999-08-01), Miller et al.
patent: 5973417 (1999-10-01), Goetz et al.
patent: 6230543 (2001-05-01), Froehling et al.
patent: 6353324 (2002-03-01), Uber et al.
patent: 6647782 (2003-11-01), Toyoda
patent: 6661239 (2003-12-01), Ozick
patent: 6710629 (2004-03-01), Lee
patent: 6724612 (2004-04-01), Davis et al.
patent: 6867602 (2005-03-01), Davis et al.
patent: 2004/0032268 (2004-02-01), Schulte
patent: 2004/0051396 (2004-03-01), Supper et al.
patent: 2004/0190327 (2004-09-01), Baker
Precise Impedance Measurement of Electrical Components Mar. 30, 2005 [http://www.cy-sensors.com/Impedance.htm].

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