Data processing: measuring – calibrating – or testing – Calibration or correction system – Sensor or transducer
Reexamination Certificate
2011-01-25
2011-01-25
Lau, Tung S (Department: 2863)
Data processing: measuring, calibrating, or testing
Calibration or correction system
Sensor or transducer
Reexamination Certificate
active
07877221
ABSTRACT:
A sense signal outputted from a sensor element and a reference voltage having a constant voltage level are selectively inputted to an amplifier, and amplified signals thereof are sequentially outputted as A/D-converted data by an A/D converter. An average of a predetermined number of A/D-converted data corresponding to the reference voltage is calculated, and a correction value is obtained by subtracting the average from one of the A/D-converted data corresponding to the reference voltage. Corrected data is obtained by subtracting the correction value from each A/D-converted data corresponding to the sense signal outputted from the sensor.
REFERENCES:
patent: 56-021417 (1981-02-01), None
patent: 09-043264 (1997-02-01), None
patent: 2003-264462 (2003-09-01), None
Japanese Patent Application Office Action Dated Jan. 19, 2010 with English Translation.
Lau Tung S
Oki Semiconductor Co., Ltd.
Volentine & Whitt P.L.L.C.
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